Services

100% EXPERIENCED EXPERTISE

Our Engineers are 100% experienced in the following fields

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DEVICE CHARACTERIZATION

For all you Load Pull and Noise measurements, CRF will guide you through the process of identifying the right measurement topology:

  • Fundamental VS. Harmonic Tuners
  • Passive VS. Active and Hybrid Loapdpull
  • Scalar VS. Vector Receivers measurments
  • Compact Modeling
  • Behavioral Modeling
  • Noise Parameters Extraction
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CIRCUIT MODELING AND MEASUREMENTS

state-of-the-art behavioral modeling of different circuits such as Low Noise and High Power Amplifiers, Mixers, Limiters, Multi-function chips (vector modulators) or passive circuits such as high selective narrow band filters. These models can be used in system simulators, they are exported with their own equation solvers, facilitating the system data flow and transient simulations, without circuit co-simulations.

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SYSTEM MODELING

The system Modeler enables concatenating several models of different circuits together, according to the architecture of the system to be designed. Through this macro-model, it is then possible to validate the global response of the RF chain, and to simulate its performance in transient simulation mode or in data-flow mode.

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RF COMPONENTS

As the strongest chain is only as good as its weakest link, so is the most advanced measurement influenced by the smallest interconnect. CRF will guide you through the qualification of your components and help you get the most accurate measurements from your systems. From components to systems, CRF provides measurements and modeling services including:

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MEASUREMENT AND MODELING SERVICES

From components to systems, CRF provides measurements and modeling services including:

  • Load Pull and Noise charcterization
  • Compact Modeling
  • Behavioral Modeling
  • System Modeling
  • and more...
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Burn-In & Life Test Solutions

Modular system providing flexibility and accuracy when determining DC and RF performances’ degradation:

  • Dedicated stimulus and measurements modules for every channel
  • The only system that allows simultaneous multi-technology and multi-device performances’ degradation monitoring.
  • Independent temperature control and measurement for each channel or surface.
  • Embedded memory in the mainframe to avoid any data loss.